Journal
Scientific and technical journal «Priborostroenie»
UDK004.031.6
Issue:10 (55)
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METHOD OF REVERSE RANDOM SAMPLING FOR MEASUREMENT OF TIME DELAY IN ELEMENT OF THE INTEGRATED CIRCUIT WITH PICOSECOND ACCURACY
Annotation
A new method of propagation delay measurement in micro- and nanostructures is described. The method makes it possible to observe the propagation time delay in a single element of standard-cell library and is accurate to better than 1 picoseconds.
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