Journal
Scientific and technical journal «Priborostroenie»
UDK681.2-2; 67.05
Issue:1 (55)
Download PDF437 Kbyte
A goniometrical device for investigation of angle dependences of photovoltage response of conductive films is presented. This device allows for variation of laser beam incidence angle and rotate the film under investigation relative to normal to its surface without displacement of laser action area on the film surface.