Journal
Scientific and technical journal «Priborostroenie»
UDK621.396.6
Issue:7 (59)
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USE OF PARETO DIAGRAM FOR ENSURING QUALITY OF INTEGRATED CIRCUIT FUNCTIONING
Annotation
An approach to the problem of ensuring quality of semiconductor devices and integrated circuits (IMS) functioning is proposed. The approach is based on application of Pareto chart demonstrating dependence of an IMS failure on the type of its defect. The main types of defects causing the major part of IMS failures are defined.
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Articles in current issue
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