Journal
Scientific and technical journal «Priborostroenie»
UDK629.78.054:621.382.8
Issue:4 (54)
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MINIMAL NECESSARY EXTENT OF EXAMINATIONS OF MICROELECTRONIC PRODUCTS AT INSPECTION TEST STAGE
Annotation
The minimal necessary extent of screening tests for microelectronic products to be used in space vehicle apparatus is determined. The proposed approach allows for reduction of cost of inspection tests carried out to ensure reliability of the apparatus and the space vehicle as a whole.
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Articles in current issue
- ANALYSIS OF OPERATION MODES OF QUASI-RESONANT VOLTAGE CONVERTER
- UNIFICATION OF INTERFACE MODULES OF ONBOARD CONTROL SYSTEM UNITS
- ELECTROSTATIC RELAY ON THE BASE OF MICROELECTROMECHANICAL TECHNOLOGY
- PHYSICAL MODELING OF CHARACTERISTICS OF PUMP IN SPACE VEHICLE HEAT REGULATION SYSTEM
- ON ABSOLUTE STABILITY OF PROCESSES IN SOLAR ARRAY SIMULATOR
- IDENTIFICATION OF ALLOY GRADE WITH THE USE OF NONDESTRUCTIVE CONTROL METHODS
- CORRECTION OF ENDURANCE TEST DATA FOR ELECTROMECHANICAL DEVICES UNDER SMALL SAMPLES CONDITIONS
- ON MATHEMATICAL MODELING OF ELECTRICAL TESTING OF COMMUNICATION SATELLITES
- MATHEMATICAL PLANNING OF EXPERIMENT UNDER FACTOR NICHE CONDITIONS
- APPLICATION OF MATHEMATICAL PLANNING OF EXPERIMENT METHOD FOR NEURAL NETWORK TRAINING
- INVESTIGATION OF ONBOARD APPARATUS COMPONENTS UNDER SPACE CONDITIONS
- ARCHITECTURE OF AN EDA-SYSTEM ON THE BASE OF COMPETITIVE PARALLEL PROCESSES
- NONPARAMETRIC ALGORITHMS OF PATTERN RECOGNITION IN THE PROBLEM OF HYPOTHESIS TESTING ON DISTRIBUTIONS OF RANDOM VARIABLES
- NONPARAMETRIC ALGORITHM OF AUTOMATIC CLASSIFICATION OF STATISTICAL DATA