Journal
Scientific and technical journal «Priborostroenie»
UDK53.082.54
Issue:9 (56)
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STUDY ON APPLICATION OF SEMICONDUCTOR LASER TO DIFFRACTOMETRY
Annotation
Spatial coherence of semiconductor laser with the wavelength of 630 nm is studied experimentally. Revealed high degree of spatial coherence is shown to allow for application of the laser to diffractometry. The possibility to obtain diffraction pattern of sufficient contrast is demonstrated by the example of slit diffraction of radiation generated by the laser under consideration.
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Articles in current issue
- HIGH-POWERED COMPACT ND:YAG LASER WITH UNSTABLE RESONATOR
- DIODE-PUMPED SOLID-STATE LASERS FOR 3-D SUBSURFACE MARKING OF TRANSPARENT DIELECTRIC
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- SPATIAL AND ENERGETIC CHARACTERISTICS OF LIGHT-EMITTING DIODES USED IN PHOTOCHROMOTHERAPY
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- ANALYSIS OF OPTICAL RADIANCE POWER AND TEMPERATURE OF UV LED CHIPS IN THE PULSED MODE
- DETERMINATION OF CONTRAST SENSITIVITY FUNCTION FOR TECHNICAL VISION SYSTEM
- MODEL OF VISUALIZATION FOR RANDOM PHASE OBJECT
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