Journal
Scientific and technical journal «Priborostroenie»
UDK53.084.85
Issue:3 (58)
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METROLOGICAL STUDY OF ATOMIC EMISSION SPECTROMETERS BASED ON CCD LINES
Annotation
Analytical capabilities and metrological characteristics of commercial atomic emission spectrometers using CCD lines as optical detectors are studied. Results of experiments on detection limits and accuracy of measurements of chemical elements concentrations in samples of metals and alloys are presented.
Keywords
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