AUTOCORRELATION FUNCTION OF SCATTERED RADIATION IN ATTENUATED TOTAL REFLECTION SCHEME FOR NANOPARTICLE SIZE MEASUREMENT
Annotation
The method of nanoparticles size measurement based on photon correlation analysis is considered. An attenuated total reflectance scheme is proposed for reduction of influence from convective flows on the measurement accuracy. Autocorrelation function of scattered light intensity is determined for the scheme, and the proposed approach is shown to afford a significant decrease in time required for particle size measurement and an improvement in accuracy of the method.
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