STUDY OF RADIATION RESISTANCE OF DIELECTRIC COATING DEPOSITED ON OPTICAL SURFACE
Annotation
A method for laser induced damage (LID) threshold measurement both within volume of transparent dielectrics and at surface of high-energy laser optical components is proposed. The technique makes it possible to determine the optical breakdown statistics in a chosen area of optical element for single-shot exposure and for accumulation regime. A technique of additional chemical-mechanical surface polishing is proposed, the LID threshold for coatings of optical components with surfaces subjected to the additional processing is measured and compared with regular treatment.
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