Journal
Scientific and technical journal of information technologies, mechanics and optics
UDK548, 546.06
Issue:4 (68)
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INVESTIGATION OF LANTHANUM GALLATES BY X-RAY DIFFRACTION ANALYSIS
Annotation
The work deals with the study of phase composition of poorly-type semiconductors - Lanthanum Gallates Perovskite (LaGaO3) doped with a touch of Co3+ (up to 10%) by X-ray diffraction analysis. Comparative analysis of X-ray pictures shows that cobalt impurity concentration growth in the mixed crystals LaGaСохO3 leads to insufficient deformation of cubic crystal lattice with the decrease of elementary cell parameter by 0, 03 nm. Nevertheless, in Lanthanum gallates the local symmetry decrease is possible and it becomes apparent on X-ray pictures as diffraction maximum splitting.
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