Journal
ИЗВЕСТИЯ ВЫСШИХ УЧЕБНЫХ ЗАВЕДЕНИЙ «ПРИБОРОСТРОЕНИЕ»
UDK535.51:681.4.023
Issue:10 (51)
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ELLIPSOMETRY OF OPTICAL CONNECTIONS OPTOELECTRONICS ELEMENTS
Annotation
Ellipsometry method of the analysis of polarization-optical properties of elements of optoelectronics in without adhesive optical connections are considered. Methods of diagnostics tensely-deformed conditions of elements and definitions of their optical characteristics in a zone of optical contact of non-uniform superficial layers are submitted.
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Articles in current issue
- PARALLEL ALGORITHMS FOR COMPLEX NETWORKS SIMULATIONS
- METHODS OF DATA PROCESSING OPTICAL MEASUREMENTS ON THE BASIS OF VECTOR REDUCED EVALUATION
- AUTOMATION OF A SAFETY OF CORPORATE NETWORKS
- CONTROL OF COURSE MOVEMENTS OF A CAR USING AN ALGORITHM OF SEQUENTIAL OPTIMIZATION
- ANALYZE OF DIFFICULT MULTIIMAGES IN A MODE OF REAL TIME
- THE DESIGN OF THE REDUNDANT FAULT-TOLERANT CONTROL SYSTEM SOFTWARE
- DEFINITION OF PARAMETERS OF MODEL OF THE ASYNCHRONOUS ENGINE ON THE HELP DATA
- DEVELOPMENT OF TELEVISION METHODS OF TUBES GEOMETRIC PARAMETERS MEASUREMENT
- MODULE OF MANAGEMENT OF THE NMR-TOMOGRAPH
- RESEARCH OF ABILITY DISCLOSURE OBJECTS ON BASIS OF POLARISED CONTRAST
- PARAMETRICAL METHOD OF CONSTRUCTION OF THE ELLIPSE OF POLARIZATION OF RADIATION
- INFLUENCE DECREASING PARALLAX ON VIDEOIMAGES STABILIZATION ERROR
- NULL CORRECTORS FOR THE ASPHERICAL SURFACES IN THE SCHEMES OF THE MIRROR TELESCOPES
- COMPOSITION MULTICHANNEL INFRARED AND MILLIMETER WAVE BAND DEVICES
- SOME PROPERTIES OF SILICON STRUCTURES, RECEIVED BY LASER MICROSTRUCTURIZATION
- INVESTIGATION OF THE COMPOSITION OF PETROLEUM-WATER-GAS MIXTURE BY NUCLEAR MAGNETIC RESONANCE METHOD